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Cu Pad Surface Height Evaluation Technique by In-line SEM for Wafer Hybrid Bonding
Publication:
Cu Pad Surface Height Evaluation Technique by In-line SEM for Wafer Hybrid Bonding
Date
2024
Proceedings Paper
https://doi.org/10.1117/12.3008658
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1.19 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kasai, Hiroaki
;
Osaki, Mayuka
;
Hasumi, Kazuhisa
;
Mise, Nobuyuki
;
Tanaka, Maki
;
Tunca Altintas, Bensu
;
Chew, Soon Aik
;
Bogdanowicz, Janusz
;
Moussa, Alain
;
Saib, Mohamed
;
Zhang, Boyao
;
Charley, Anne-Laure
Journal
Proceedings of SPIE
Abstract
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218
since deposited on 2024-06-15
Acq. date: 2025-10-23
Views
645
since deposited on 2024-06-15
Acq. date: 2025-10-23
Citations
Metrics
Downloads
218
since deposited on 2024-06-15
Acq. date: 2025-10-23
Views
645
since deposited on 2024-06-15
Acq. date: 2025-10-23
Citations