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Gate induced floating body effects in TiN/SiON and TiN/HfO2 triple gate SOI FinFETs
Publication:
Gate induced floating body effects in TiN/SiON and TiN/HfO2 triple gate SOI FinFETs
Date
2007
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rafi, J.M.
;
Simoen, Eddy
;
Mercha, Abdelkarim
;
Collaert, Nadine
;
Hayama, K.
;
Campabadal, F.
;
Claeys, Cor
Journal
Solid-State Electronics
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1958
since deposited on 2021-10-16
428
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1958
since deposited on 2021-10-16
428
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations