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TXRF layer analysis for advanced micro-electronic applications: a two case study, HfO2/Si and Si/Ge
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1934 since deposited on 2021-10-16
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Acq. date: 2026-03-17
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1934 since deposited on 2021-10-16
1last month
1last week
Acq. date: 2026-03-17
Citations