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Observation of stacking faults and prismatic punching systems in silicon by light scattering tomography
Publication:
Observation of stacking faults and prismatic punching systems in silicon by light scattering tomography
Date
1996
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kissinger, G.
;
Vanhellemont, Jan
;
Claeys, Cor
;
Richter, H.
Journal
Journal of Crystal Growth
Abstract
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1996
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
1996
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations