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Formation of misfit dislocations at the thin strained Si/strain relaxed buffer interface
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Formation of misfit dislocations at the thin strained Si/strain relaxed buffer interface
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Date
2005
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Loo, Roger
;
Delhougne, Romain
;
Caymax, Matty
;
Ries, Mike
Journal
Applied Physics Letters
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1905
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Acq. date: 2026-08-09
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Views
1905
since deposited on 2021-10-16
1
last month
Acq. date: 2026-08-09
Citations