Publication:
Formation of misfit dislocations at the thin strained Si/strain relaxed buffer interface
Date
| dc.contributor.author | Loo, Roger | |
| dc.contributor.author | Delhougne, Romain | |
| dc.contributor.author | Caymax, Matty | |
| dc.contributor.author | Ries, Mike | |
| dc.contributor.imecauthor | Loo, Roger | |
| dc.contributor.imecauthor | Delhougne, Romain | |
| dc.contributor.imecauthor | Caymax, Matty | |
| dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
| dc.date.accessioned | 2021-10-16T03:01:30Z | |
| dc.date.available | 2021-10-16T03:01:30Z | |
| dc.date.issued | 2005-10 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10801 | |
| dc.source.beginpage | 182108-1 | |
| dc.source.endpage | 182108-3 | |
| dc.source.issue | 18 | |
| dc.source.journal | Applied Physics Letters | |
| dc.source.volume | 87 | |
| dc.title | Formation of misfit dislocations at the thin strained Si/strain relaxed buffer interface | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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