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Influence of oxygen desorption on in-situ analysis of the surface composition during O2+ bombardment of Si

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dc.contributor.authorJanssens, Tom
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorVandervorst, Wilfried
dc.date.accessioned2021-10-16T16:55:54Z
dc.date.available2021-10-16T16:55:54Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12358
dc.source.beginpage763
dc.source.endpage771
dc.source.issue3
dc.source.journalSurface Science
dc.source.volume601
dc.title

Influence of oxygen desorption on in-situ analysis of the surface composition during O2+ bombardment of Si

dc.typeJournal article
dspace.entity.typePublication
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