Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Comprehensive study of TSUPREM4 boron diffusion modeling in SiGeC base layers under critical RTA conditions
Publication:
Comprehensive study of TSUPREM4 boron diffusion modeling in SiGeC base layers under critical RTA conditions
Copy permalink
Date
2004
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sibaja-Hernandez, Arturo
;
Xu, Mingwei
;
Decoutere, Stefaan
;
Maes, Herman
Journal
Abstract
Description
Statistics
Views
1971
since deposited on 2021-10-15
2
last month
2
last week
Acq. date: 2026-09-18
Citations
Statistics
Views
1971
since deposited on 2021-10-15
2
last month
2
last week
Acq. date: 2026-09-18
Citations