Publication:
Profiling different kind of generated defects at elevated temperatures in both SiO2 and high-k dielectrics
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1944 since deposited on 2021-10-18
9last month
3last week
Acq. date: 2026-08-09
Citations
Statistics
Views
1944 since deposited on 2021-10-18
9last month
3last week
Acq. date: 2026-08-09
Citations