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ToF-SIMS depth profiling of Hf and Al composition variations in ultrathin mixed HfO2/Al2O3 oxides
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ToF-SIMS depth profiling of Hf and Al composition variations in ultrathin mixed HfO2/Al2O3 oxides
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Date
2004
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Houssiau, L.
;
Vitchev, R.G.
;
Conard, Thierry
;
Vandervorst, Wilfried
;
Bender, Hugo
Journal
Applied Surface Science
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1928
since deposited on 2021-10-15
Acq. date: 2025-12-11
Citations
Metrics
Views
1928
since deposited on 2021-10-15
Acq. date: 2025-12-11
Citations