Publication:
Saturation threshold voltage degradation in deep-submicrometer fully depleted SOI nMOSFETs operating in cryogenic environments
Date
Loading...
Journal
Abstract
Description
Metrics
Views
1942 since deposited on 2021-10-16
Acq. date: 2025-12-15
Citations
Metrics
Views
1942 since deposited on 2021-10-16
Acq. date: 2025-12-15
Citations