Publication:
Saturation threshold voltage degradation in deep-submicrometer fully depleted SOI nMOSFETs operating in cryogenic environments
Date
| dc.contributor.author | Pavanello, M.A. | |
| dc.contributor.author | Martino, J.A. | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-16T04:00:35Z | |
| dc.date.available | 2021-10-16T04:00:35Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11004 | |
| dc.source.beginpage | 72 | |
| dc.source.conference | Proceedings of the IEEE International SOI Conference | |
| dc.source.conferencedate | 3/10/2005 | |
| dc.source.conferencelocation | Honolulu, HI USA | |
| dc.source.endpage | 73 | |
| dc.title | Saturation threshold voltage degradation in deep-submicrometer fully depleted SOI nMOSFETs operating in cryogenic environments | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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