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Conference contributions
3D system integration using through-Si via technologies. Definitions, roadmaps, technical challenges and solutions to economical barriers
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3D system integration using through-Si via technologies. Definitions, roadmaps, technical challenges and solutions to economical barriers
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Date
2009
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19573.pdf
13.53 MB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Beyne, Eric
Journal
Abstract
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1894
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Acq. date: 2025-12-15
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Metrics
Views
1894
since deposited on 2021-10-17
1
last month
Acq. date: 2025-12-15
Citations