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Articles
Time-dependent dielectric breakdown on subnanometer EOT nMOS FinFETs
Publication:
Time-dependent dielectric breakdown on subnanometer EOT nMOS FinFETs
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Date
2012
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25517.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Feijoo, Pedro C.
;
Kauerauf, Thomas
;
Toledano Luque, Maria
;
Togo, Mitsuhiro
;
San Andrés, Enrique
;
Groeseneken, Guido
Journal
IEEE Transactions on Device and Materials Reliability
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1891
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Acq. date: 2025-12-13
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Views
1891
since deposited on 2021-10-20
1
last month
1
last week
Acq. date: 2025-12-13
Citations