Publication:
Time-dependent defect spectroscopy for characterization of border traps in metal-oxide-semiconductor transistors
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1982 since deposited on 2021-10-18
2last month
Acq. date: 2025-12-11
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Metrics
Views
1982 since deposited on 2021-10-18
2last month
Acq. date: 2025-12-11
Citations