Application of scanning spreading resistance microscopy (SSRM) for GaN-on-silicon power structures

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Author(s)

Kandaswamy, Prem Kumar

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Saripalli, Yoga

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Van Hove, Marleen

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Vanhaeren, Danielle

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Vanderheyden, Annelies

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Schulze, Andreas

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Decoutere, Stefaan

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Vandervorst, Wilfried

Metrics

2036 since deposited on 2021-10-22

Acq. date: 2025-10-23