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Application of scanning spreading resistance microscopy (SSRM) for GaN-on-silicon power structures

Date

2014
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dc.contributor.authorKandaswamy, Prem Kumar
dc.contributor.authorSaripalli, Yoga
dc.contributor.authorVan Hove, Marleen
dc.contributor.authorYou, Shuzhen
dc.contributor.authorZhao, Ming
dc.contributor.authorLiang, Hu
dc.contributor.authorVanhaeren, Danielle
dc.contributor.authorVanderheyden, Annelies
dc.contributor.authorSchulze, Andreas
dc.contributor.authorEyben, Pierre
dc.contributor.authorDecoutere, Stefaan
dc.contributor.authorLanger, Robert
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorYou, Shuzhen
dc.contributor.imecauthorZhao, Ming
dc.contributor.imecauthorLiang, Hu
dc.contributor.imecauthorVanhaeren, Danielle
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.imecauthorLanger, Robert
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecZhao, Ming::0000-0002-0856-851X
dc.contributor.orcidimecVanhaeren, Danielle::0000-0001-8624-9533
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.contributor.orcidimecLanger, Robert::0000-0002-1132-3468
dc.date.accessioned2021-10-22T02:27:56Z
dc.date.available2021-10-22T02:27:56Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24030
dc.source.conferenceInternational Workshop on Nitride Semiconductors - IWN
dc.source.conferencedate24/08/2014
dc.source.conferencelocationWroclaw Poland
dc.title

Application of scanning spreading resistance microscopy (SSRM) for GaN-on-silicon power structures

dc.typeMeeting abstract
dspace.entity.typePublication
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