Publication:
Silicon layer used as a holes detector in thin HfO2 films deposited by atomic layer deposition
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1781 since deposited on 2021-10-15
Acq. date: 2026-03-01
Citations
Statistics
Views
1781 since deposited on 2021-10-15
Acq. date: 2026-03-01
Citations