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Electrical characterization and reliability study of integrated GaN power amplifier in multi-layer thin-film technology
Publication:
Electrical characterization and reliability study of integrated GaN power amplifier in multi-layer thin-film technology
Date
2011
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Liu, Rui
;
Schreurs, Dominique
;
De Raedt, Walter
;
Vanaverbeke, Fre
;
Das, Jo
;
Mertens, Robert
;
De Wolf, Ingrid
Journal
Microelectronics Reliability
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1862
since deposited on 2021-10-19
Acq. date: 2025-10-24
Citations
Metrics
Views
1862
since deposited on 2021-10-19
Acq. date: 2025-10-24
Citations