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Electrical characterization and reliability study of integrated GaN power amplifier in multi-layer thin-film technology
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Electrical characterization and reliability study of integrated GaN power amplifier in multi-layer thin-film technology
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Date
2011
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Liu, Rui
;
Schreurs, Dominique
;
De Raedt, Walter
;
Vanaverbeke, Fre
;
Das, Jo
;
Mertens, Robert
;
De Wolf, Ingrid
Journal
Microelectronics Reliability
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1865
since deposited on 2021-10-19
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Acq. date: 2025-12-11
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Metrics
Views
1865
since deposited on 2021-10-19
1
last month
Acq. date: 2025-12-11
Citations