Electrical characterization and reliability study of integrated GaN power amplifier in multi-layer thin-film technology

dc.contributor.author	Liu, Rui
dc.contributor.author	Schreurs, Dominique
dc.contributor.author	De Raedt, Walter
dc.contributor.author	Vanaverbeke, Fre
dc.contributor.author	Das, Jo
dc.contributor.author	Mertens, Robert
dc.contributor.author	De Wolf, Ingrid
dc.contributor.imecauthor	Schreurs, Dominique
dc.contributor.imecauthor	De Raedt, Walter
dc.contributor.imecauthor	Mertens, Robert
dc.contributor.imecauthor	De Wolf, Ingrid
dc.contributor.orcidimec	De Raedt, Walter::0000-0002-7117-7976
dc.contributor.orcidimec	De Wolf, Ingrid::0000-0003-3822-5953
dc.date.accessioned	2021-10-19T15:36:46Z
dc.date.available	2021-10-19T15:36:46Z
dc.date.issued	2011
dc.identifier.issn	0026-2714
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/19314
dc.source.beginpage	1721
dc.source.endpage	1724
dc.source.issue	9_11
dc.source.journal	Microelectronics Reliability
dc.source.volume	51
dc.title	Electrical characterization and reliability study of integrated GaN power amplifier in multi-layer thin-film technology
dc.type	Journal article
dspace.entity.type	Publication
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