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Conference contributions
Fin dimension influence on mechanical stressors in triple-gate SOI nMOSFETs
Publication:
Fin dimension influence on mechanical stressors in triple-gate SOI nMOSFETs
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Date
2013
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Buhler, Rudolf
;
Simoen, Eddy
;
Agopian, Paula
;
Claeys, Cor
;
Martino, Joao
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Views
1885
since deposited on 2021-10-21
1
last month
1
last week
Acq. date: 2025-12-11
Citations