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Fin dimension influence on mechanical stressors in triple-gate SOI nMOSFETs
Publication:
Fin dimension influence on mechanical stressors in triple-gate SOI nMOSFETs
Date
2013
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Buhler, Rudolf
;
Simoen, Eddy
;
Agopian, Paula
;
Claeys, Cor
;
Martino, Joao
Journal
Abstract
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1884
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Acq. date: 2025-10-29
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Views
1884
since deposited on 2021-10-21
2
last week
Acq. date: 2025-10-29
Citations