Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Electrical characterization of silicon-rich-oxide-based memory cells using pulsed current-voltage techniques
Publication:
Electrical characterization of silicon-rich-oxide-based memory cells using pulsed current-voltage techniques
Copy permalink
Date
2002
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
6317.pdf
542.06 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rosmeulen, Maarten
;
Sleeckx, Erik
;
De Meyer, Kristin
Journal
Abstract
Description
Metrics
Views
1786
since deposited on 2021-10-14
Acq. date: 2025-12-15
Citations
Metrics
Views
1786
since deposited on 2021-10-14
Acq. date: 2025-12-15
Citations