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A metal hardmask approach for the contact patterning of a 0.186 μm² SRAM cell exposed with EUV lithography
Publication:
A metal hardmask approach for the contact patterning of a 0.186 μm² SRAM cell exposed with EUV lithography
Date
2008
Meeting abstract
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17398.pdf
120.08 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
de Marneffe, Jean-Francois
;
Goossens, Danny
;
Vandervorst, Alain
;
Demuynck, Steven
;
Goethals, Mieke
;
Hermans, Jan
;
Van Roey, Frieda
;
Baudemprez, Bart
;
Brus, Stephan
;
Vrancken, Christa
Journal
Abstract
Description
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Downloads
2
since deposited on 2021-10-17
Acq. date: 2025-10-23
Views
2003
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Downloads
2
since deposited on 2021-10-17
Acq. date: 2025-10-23
Views
2003
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations