Publication:
Interface sharpness in stacked thin film structures: a comparison of soft X-ray reflectometry and transmission electron microscopy
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Acq. date: 2026-10-07
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359 since deposited on 2025-01-09
28last month
6last week
Acq. date: 2026-10-07
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151 since deposited on 2025-01-09
Acq. date: 2026-10-07
Citations