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Wet Cu passivation for high throughput fluxless Thermal Compression Bonding of Cu-Sn μbumps for Die-to-Wafer stacking
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Wet Cu passivation for high throughput fluxless Thermal Compression Bonding of Cu-Sn μbumps for Die-to-Wafer stacking
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Date
2024
Proceedings Paper
https://doi.org/10.1109/ECTC51529.2024.00311
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rip, Jens
;
Derakhshandeh, Jaber
;
Negishi, Ryo
;
Tomatsu, Itsuro
;
Cuypers, Dieter H.
;
Beyne, Eric
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N/A
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375
since deposited on 2024-12-07
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last month
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last week
Acq. date: 2025-12-15
Citations
Metrics
Views
375
since deposited on 2024-12-07
3
last month
1
last week
Acq. date: 2025-12-15
Citations