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Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures
Publication:
Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures
Date
2022
Journal article
https://doi.org/10.1002/smll.202105776
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hoenicke, Philipp
;
Kayser, Yves
;
Nikolaev, Konstantin, V
;
Soltwisch, Victor
;
Scheerder, Jeroen
;
Fleischmann, Claudia
;
Siefke, Thomas
;
Andrle, Anna
;
Gwalt, Grzegorz
;
Siewert, Frank
;
Davis, Jeffrey
;
Huth, Martin
;
Veloso, Anabela
;
Loo, Roger
;
Skroblin, Dieter
;
Steinert, Michael
;
Undisz, Andreas
;
Rettenmayr, Markus
;
Beckhoff, Burkhard
Journal
SMALL
Abstract
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170
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1394
since deposited on 2021-12-02
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Downloads
170
since deposited on 2021-12-02
47
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Views
1394
since deposited on 2021-12-02
393
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations