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Development and analysis of thick GaN drift layers on 200 mm CTE-matched substrate for vertical device processing

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121 since deposited on 2023-11-19
Acq. date: 2025-10-24

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955 since deposited on 2023-11-19
Acq. date: 2025-10-24

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121 since deposited on 2023-11-19
Acq. date: 2025-10-24

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955 since deposited on 2023-11-19
Acq. date: 2025-10-24

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