Publication:

The smaller the noisier? Low frequency noise diagnostics of advanced semiconductor devices

Date

2015

Proceedings Paper

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Files

32331.pdf 2.3 MB

Author(s)

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Aoulaiche, Marc

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Vandooren, Anne

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Rooyackers, Rita

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Veloso, Anabela

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Collaert, Nadine

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Statistics

1817 since deposited on 2021-10-22

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Acq. date: 2026-08-24