Publication:

The smaller the noisier? Low frequency noise diagnostics of advanced semiconductor devices

Date

2015
Proceedings Paper
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dc.contributor.authorClaeys, Cor
dc.contributor.authorSimoen, Eddy
dc.contributor.authorAgopian, Paula
dc.contributor.authorMartino, J.A.
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorCretu, Bogdan
dc.contributor.authorVandooren, Anne
dc.contributor.authorRooyackers, Rita
dc.contributor.authorVeloso, Anabela
dc.contributor.authorJurczak, Gosia
dc.contributor.authorCollaert, Nadine
dc.contributor.authorThean, Aaron
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorVandooren, Anne
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecVandooren, Anne::0000-0002-2412-0176
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2021-10-22T18:42:44Z
dc.date.available2021-10-22T18:42:44Z
dc.date.embargo9999-12-31
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25085
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7298104
dc.source.beginpage1
dc.source.conference30th Symposium on Microelectronics Technology and Devices - SBMicro
dc.source.conferencedate1/09/2015
dc.source.conferencelocationBahia Brazil
dc.source.endpage6
dc.title

The smaller the noisier? Low frequency noise diagnostics of advanced semiconductor devices

dc.typeProceedings paper
dspace.entity.typePublication
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