Publication:

An ESCA study on ion beam induced oxidation of Si

Date

 
dc.contributor.authorOsiceanu, Petre
dc.contributor.authorAlay, Josep Lluis
dc.contributor.authorDe Coster, Walter
dc.date.accessioned2021-09-29T13:15:38Z
dc.date.available2021-09-29T13:15:38Z
dc.date.embargo9999-12-31
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/809
dc.source.beginpage159
dc.source.conference18th International Semiconductor Conference. CAS'95 Proceedings
dc.source.conferencedate10/10/1995
dc.source.conferencelocationSinaia Romania
dc.source.endpage62
dc.title

An ESCA study on ion beam induced oxidation of Si

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
783.pdf
Size:
369.5 KB
Format:
Adobe Portable Document Format
Publication available in collections: