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Special Series Guest Editorial: EUV Masks
Publication:
Special Series Guest Editorial: EUV Masks
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Date
2021
Editorial Material
https://doi.org/10.1117/1.JMM.20.3.031008
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57.65 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Burkhardt, Martin
;
Philipsen, Vicky
Journal
JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3
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Downloads
198
since deposited on 2021-11-02
5
last month
2
last week
Acq. date: 2026-02-24
Views
1740
since deposited on 2021-11-02
1
last month
1
last week
Acq. date: 2026-02-24
Citations