Publication:
Channel and near channel defects characterization in vertical InxGa1-xAs high mobility channels for future 3D NAND memory
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1937 since deposited on 2021-10-23
1last month
Acq. date: 2025-12-10
Citations
Metrics
Views
1937 since deposited on 2021-10-23
1last month
Acq. date: 2025-12-10
Citations