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Correlation between pattern density and linewidth variation in silicon photonics waveguides
Publication:
Correlation between pattern density and linewidth variation in silicon photonics waveguides
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Date
2020-03
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Xing, Yufei
;
Dong, Jiaxing
;
Khan, Muhammad Umar
;
Bogaerts, Wim
Journal
Optics Express
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1957
since deposited on 2021-10-29
1
last month
Acq. date: 2025-12-10
Citations
Metrics
Views
1957
since deposited on 2021-10-29
1
last month
Acq. date: 2025-12-10
Citations