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Contact resistivity of laser annealed SiGe for MEMS structural layers deposited at 210C
Publication:
Contact resistivity of laser annealed SiGe for MEMS structural layers deposited at 210C
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Date
2011
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
El Rifai, Joumana
;
Witvrouw, Ann
;
Abdel Aziz, Ahmed
;
Puers, Bob
;
Van Hoof, Chris
;
Sedky, Sherif
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1887
since deposited on 2021-10-19
Acq. date: 2025-12-13
Citations
Metrics
Views
1887
since deposited on 2021-10-19
Acq. date: 2025-12-13
Citations