Publication:
Vacuum ultra-violet damage and damage mitigation for plasma processing of highly porous organosilicate glass dielectrics
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.orcid | 0000-0001-5178-6670 | |
| cris.virtual.orcid | 0000-0001-6215-8506 | |
| cris.virtual.orcid | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.orcid | 0000-0003-2454-0602 | |
| cris.virtual.orcid | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtualsource.department | bce8c338-4d24-430a-a452-479a72e43639 | |
| cris.virtualsource.department | c896eb73-5708-4d20-a4cd-a17e9ff45cf0 | |
| cris.virtualsource.department | bcdff4f0-2d0d-477d-b384-4268536d7fe2 | |
| cris.virtualsource.department | 9c91d1fc-e61a-43a6-86bd-9f01969da8a0 | |
| cris.virtualsource.department | 5fc73164-72f0-4f1a-a4a8-c759f8c39c67 | |
| cris.virtualsource.orcid | bce8c338-4d24-430a-a452-479a72e43639 | |
| cris.virtualsource.orcid | c896eb73-5708-4d20-a4cd-a17e9ff45cf0 | |
| cris.virtualsource.orcid | bcdff4f0-2d0d-477d-b384-4268536d7fe2 | |
| cris.virtualsource.orcid | 9c91d1fc-e61a-43a6-86bd-9f01969da8a0 | |
| cris.virtualsource.orcid | 5fc73164-72f0-4f1a-a4a8-c759f8c39c67 | |
| dc.contributor.author | de Marneffe, Jean-Francois | |
| dc.contributor.author | Zhang, Liping | |
| dc.contributor.author | Heyne, Markus | |
| dc.contributor.author | Lukaszewicz, Mikolasj | |
| dc.contributor.author | Porter, Stephen Barry | |
| dc.contributor.author | Vajda, Felim | |
| dc.contributor.author | Rutigliani, Vito | |
| dc.contributor.author | Krishtab, Mikhail | |
| dc.contributor.author | Goodyear, Andy | |
| dc.contributor.author | Cooke, Mike | |
| dc.contributor.author | Verdonck, Patrick | |
| dc.contributor.author | Baklanov, Mikhaïl | |
| dc.contributor.imecauthor | de Marneffe, Jean-Francois | |
| dc.contributor.imecauthor | Zhang, Liping | |
| dc.contributor.imecauthor | Krishtab, Mikhail | |
| dc.contributor.imecauthor | Verdonck, Patrick | |
| dc.contributor.orcidimec | Verdonck, Patrick::0000-0003-2454-0602 | |
| dc.date.accessioned | 2021-10-22T18:50:40Z | |
| dc.date.available | 2021-10-22T18:50:40Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2015 | |
| dc.identifier.doi | 10.1063/1.4932202 | |
| dc.identifier.issn | 0021-8979 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/25141 | |
| dc.identifier.url | http://scitation.aip.org/content/aip/journal/jap/118/13/10.1063/1.4932202 | |
| dc.source.beginpage | 133302 | |
| dc.source.issue | 13 | |
| dc.source.journal | Journal of Applied Physics | |
| dc.source.volume | 118 | |
| dc.title | Vacuum ultra-violet damage and damage mitigation for plasma processing of highly porous organosilicate glass dielectrics | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | Original bundle
| |
| Publication available in collections: |