Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Understanding nMOSFET characteristics after soft breakdown and their dependence on the breakdown location
Publication:
Understanding nMOSFET characteristics after soft breakdown and their dependence on the breakdown location
Copy permalink
Date
2002
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
6309.pdf
242.1 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kaczer, Ben
;
Degraeve, Robin
;
Crupi, Felice
;
De Keersgieter, An
;
Groeseneken, Guido
Journal
Abstract
Description
Metrics
Views
1887
since deposited on 2021-10-14
Acq. date: 2025-12-15
Citations
Metrics
Views
1887
since deposited on 2021-10-14
Acq. date: 2025-12-15
Citations