Publication:
Impact of line height on copper resistivity and interconnect RC delay: a geometry approach to reduce the size effect
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1954 since deposited on 2021-10-16
Acq. date: 2025-12-16
Citations
Metrics
Views
1954 since deposited on 2021-10-16
Acq. date: 2025-12-16
Citations