Publication:
Hot carrier degradation on n-channel SiO2/HfSiO MOSFETs: Effects on the devices performance and lifetime
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1993 since deposited on 2021-10-16
Acq. date: 2025-10-23
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Metrics
Views
1993 since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations