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Device-Aware Test for Back-Hopping Defects in STT-MRAMs
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Device-Aware Test for Back-Hopping Defects in STT-MRAMs
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Date
2023
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Yuan, Sicong
;
Taouil, Mottaqiallah
;
Fieback, Moritz
;
Xun, Hanzhi
;
Marinissen, Erik Jan
;
Kar, Gouri Sankar
;
Rao, Siddharth
;
Couet, Sebastien
;
Hamdioui, Said
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N/A
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853
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Acq. date: 2025-12-14
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Views
853
since deposited on 2023-08-19
1
last month
1
last week
Acq. date: 2025-12-14
Citations