Publication:
Device-Aware Test for Back-Hopping Defects in STT-MRAMs
Date
| dc.contributor.author | Yuan, Sicong | |
| dc.contributor.author | Taouil, Mottaqiallah | |
| dc.contributor.author | Fieback, Moritz | |
| dc.contributor.author | Xun, Hanzhi | |
| dc.contributor.author | Marinissen, Erik Jan | |
| dc.contributor.author | Kar, Gouri Sankar | |
| dc.contributor.author | Rao, Siddharth | |
| dc.contributor.author | Couet, Sebastien | |
| dc.contributor.author | Hamdioui, Said | |
| dc.contributor.imecauthor | Yuan, Sicong | |
| dc.contributor.imecauthor | Marinissen, Erik Jan | |
| dc.contributor.imecauthor | Kar, Gouri Sankar | |
| dc.contributor.imecauthor | Couet, Sebastien | |
| dc.contributor.imecauthor | Rao, Siddharth | |
| dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
| dc.contributor.orcidimec | Couet, Sebastien::0000-0001-6436-9593 | |
| dc.contributor.orcidimec | Rao, Siddharth::0000-0001-6161-3052 | |
| dc.date.accessioned | 2024-03-21T13:58:08Z | |
| dc.date.available | 2023-08-19T18:09:56Z | |
| dc.date.available | 2024-03-21T13:58:08Z | |
| dc.date.issued | 2023 | |
| dc.description.wosFundingText | This work is supported by IMEC's Industrial Affiliation Program on STT-MRAM devices. | |
| dc.identifier.eisbn | 979-8-3503-9624-9 | |
| dc.identifier.issn | 1530-1591 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42354 | |
| dc.publisher | IEEE | |
| dc.source.conference | Design, Automation and Test in Europe Conference and Exhibition (DATE) | |
| dc.source.conferencedate | APR 17-19, 2023 | |
| dc.source.conferencelocation | Antwerp | |
| dc.source.journal | N/A | |
| dc.source.numberofpages | 6 | |
| dc.title | Device-Aware Test for Back-Hopping Defects in STT-MRAMs | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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