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Evidence of printing blank-related defects on EUV masks missed by blank inspection
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Evidence of printing blank-related defects on EUV masks missed by blank inspection
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Date
2011
Proceedings Paper
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21560.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jonckheere, Rik
;
Van Den Heuvel, Dieter
;
Hendrickx, Eric
;
Ronse, Kurt
;
Bret, Tristan
;
Hofmann, Thorsten
;
Magana, John
;
Aharonson, Israel
;
Meshulach, Doron
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1916
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Acq. date: 2025-12-11
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Views
1916
since deposited on 2021-10-19
3
last month
2
last week
Acq. date: 2025-12-11
Citations