Publication:
Charge trapping and dielectric reliability of SiO2/AI2O3 gate stacks with TiN electrodes
Date
Loading...
Journal
Abstract
Description
Statistics
Views
1925 since deposited on 2021-10-15
4last month
4last week
Acq. date: 2026-10-08
Citations
Statistics
Views
1925 since deposited on 2021-10-15
4last month
4last week
Acq. date: 2026-10-08
Citations