Publication:
Charge trapping and dielectric reliability of SiO2/AI2O3 gate stacks with TiN electrodes
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1916 since deposited on 2021-10-15
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Acq. date: 2026-01-10
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Views
1916 since deposited on 2021-10-15
1last month
1last week
Acq. date: 2026-01-10
Citations