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Investigation of light-induced deep-level defect activation at the AlN/Si interface
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Investigation of light-induced deep-level defect activation at the AlN/Si interface
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Date
2011
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Visalli, Domenica
;
Van Hove, Marleen
;
Leys, Maarten
;
Derluyn, Joff
;
Simoen, Eddy
;
Srivastava, Puneet
;
Geens, Karen
;
Degroote, Stefan
;
Germain, Marianne
;
Nguyen, Anh Phuc Duc
;
Stesmans, Andre
;
Borghs, Gustaaf
Journal
Applied Physics Express
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1941
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Acq. date: 2025-12-11
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Views
1941
since deposited on 2021-10-19
1
last month
Acq. date: 2025-12-11
Citations