Single-Event-Induced Charge Collection in Ge-Channel pMOS FinFETs

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Author(s)

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Samsel, Isaak K.

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Sternberg, Andrew

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Austin, Stephanie M.

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Alles, Michael L.

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Linten, Dimitri

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Reed, Robert A.

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Fleetwood, Daniel M.

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Schrimpf, Ronald D.

Journal

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Metrics

1760 since deposited on 2021-11-02

Acq. date: 2025-10-23