Single-Event-Induced Charge Collection in Ge-Channel pMOS FinFETs

Rony, M. W.; Samsel, Isaak K.; Zhang, En Xia; Sternberg, Andrew; Li, Kan; Reaz, Mahmud; Austin, Stephanie M.; Alles, Michael L.; Linten, Dimitri; Mitard, Jerome; Reed, Robert A.; Fleetwood, Daniel M.; Schrimpf, Ronald D.

doi:10.1109/TNS.2021.3072068

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Single-Event-Induced Charge Collection in Ge-Channel pMOS FinFETs

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2021

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https://doi.org/10.1109/TNS.2021.3072068

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IEEE TRANSACTIONS ON NUCLEAR SCIENCE

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1760 since deposited on 2021-11-02

Acq. date: 2026-01-26

Single-Event-Induced Charge Collection in Ge-Channel pMOS FinFETs

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