Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Presentations
Electrical characteristics of Ge/GeOx(N)/HfO2 gate stacks
Publication:
Electrical characteristics of Ge/GeOx(N)/HfO2 gate stacks
Copy permalink
Date
2004
Presentation
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Houssa, Michel
;
De Jaeger, Brice
;
Delabie, Annelies
;
Van Elshocht, Sven
;
Afanasiev, Valeri
;
Autran, J.L.
;
Stesmans, Andre
;
Meuris, Marc
;
Heyns, Marc
Journal
Abstract
Description
Metrics
Views
1925
since deposited on 2021-10-15
2
last month
Acq. date: 2026-01-12
Citations
Metrics
Views
1925
since deposited on 2021-10-15
2
last month
Acq. date: 2026-01-12
Citations