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Conference contributions
Hot carrier degradation and ESD in submicron CMOS technologies: how do they interact?
Publication:
Hot carrier degradation and ESD in submicron CMOS technologies: how do they interact?
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Date
2000
Proceedings Paper
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4396.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Groeseneken, Guido
Journal
Abstract
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1888
since deposited on 2021-10-14
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last month
Acq. date: 2025-12-15
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Metrics
Views
1888
since deposited on 2021-10-14
2
last month
Acq. date: 2025-12-15
Citations