Publication:

Hot carrier degradation and ESD in submicron CMOS technologies: how do they interact?

Date

2000
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorGroeseneken, Guido
dc.date.accessioned2021-10-14T13:01:24Z
dc.date.available2021-10-14T13:01:24Z
dc.date.embargo9999-12-31
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4404
dc.source.beginpage276
dc.source.conferenceProceedings 22nd EOS/ESD Symposium;
dc.source.conferencedate26/09/2000
dc.source.conferencelocationAnaheim, CA USA
dc.source.endpage286
dc.title

Hot carrier degradation and ESD in submicron CMOS technologies: how do they interact?

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
4396.pdf
Size:
142.71 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions