Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Understanding the Origin of Metal Gate Work Function Shift and Its Impact on Erase Performance in 3D NAND Flash Memories
Publication:
Understanding the Origin of Metal Gate Work Function Shift and Its Impact on Erase Performance in 3D NAND Flash Memories
Copy permalink
Date
2021
Journal article
https://doi.org/10.3390/mi12091084
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
Published version
9.27 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ramesh, Siva
;
Ajaykumar, Arjun
;
Ragnarsson, Lars-Ake
;
Breuil, Laurent
;
El Hajjam, Gabriel Khalil
;
Kaczer, Ben
;
Belmonte, Attilio
;
Nyns, Laura
;
Soulie, Jean-Philippe
;
van den Bosch, Geert
;
Rosmeulen, Maarten
Journal
MICROMACHINES
Abstract
Description
Metrics
Downloads
134
since deposited on 2023-06-20
14
last month
9
last week
Acq. date: 2025-12-10
Views
1204
since deposited on 2023-06-20
1
last month
Acq. date: 2025-12-10
Citations
Metrics
Downloads
134
since deposited on 2023-06-20
14
last month
9
last week
Acq. date: 2025-12-10
Views
1204
since deposited on 2023-06-20
1
last month
Acq. date: 2025-12-10
Citations