Publication:
Patterning challenges for direct metal etch of ruthenium and molybdenum at 32 nm metal pitch and below
| dc.contributor.author | Decoster, Stefan | |
| dc.contributor.author | Camerotto, Elisabeth | |
| dc.contributor.author | Murdoch, Gayle | |
| dc.contributor.author | Kundu, Souvik | |
| dc.contributor.author | Jurczak, Gosia | |
| dc.contributor.author | Le, Quoc Toan | |
| dc.contributor.author | Tokei, Zsolt | |
| dc.contributor.author | Lazzarino, Frederic | |
| dc.contributor.imecauthor | Decoster, Stefan | |
| dc.contributor.imecauthor | Murdoch, Gayle | |
| dc.contributor.imecauthor | Kundu, Souvik | |
| dc.contributor.imecauthor | Le, Quoc Toan | |
| dc.contributor.imecauthor | Tokei, Zsolt | |
| dc.contributor.imecauthor | Lazzarino, Frederic | |
| dc.contributor.orcidimec | Lazzarino, Frederic::0000-0001-7961-9727 | |
| dc.contributor.orcidimec | Decoster, Stefan::0000-0003-1162-9288 | |
| dc.contributor.orcidimec | Le, Quoc Toan::0000-0002-0206-6279 | |
| dc.contributor.orcidimec | Murdoch, Gayle::0000-0002-6833-220X | |
| dc.contributor.orcidimec | Kundu, Souvik::0000-0001-5815-8765 | |
| dc.contributor.orcidimec | Tokei, Zsolt::0000-0003-3545-3424 | |
| dc.date.accessioned | 2022-06-09T07:45:15Z | |
| dc.date.available | 2022-05-22T02:19:06Z | |
| dc.date.available | 2022-05-23T08:48:43Z | |
| dc.date.available | 2022-06-09T07:45:15Z | |
| dc.date.embargo | 2023-04-30 | |
| dc.date.issued | 2022-04-26 | |
| dc.description.wosFundingText | Imec has received funding from the ECSEL Joint Undertaking (JU) under Grant Agreement No. 875999. The JU receives support from the European Union's Horizon 2020 research and innovation program and the Netherlands, Belgium, Germany, France, Austria, Hungary, United Kingdom, Romania, and Israel. Furthermore, we gratefully acknowledge the 300?mm Fab operations team at imec for their support, the thin films team for the growth of the metal layers, the X-SEM and TEM (EDX) metrology teams for providing high quality images and the colleagues at imec and at Lam Research for numerous discussions and much-appreciated feedback. | |
| dc.identifier.doi | 10.1116/6.0001791 | |
| dc.identifier.issn | 2166-2746 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39869 | |
| dc.publisher | A V S AMER INST PHYSICS | |
| dc.source.beginpage | 032802 | |
| dc.source.issue | 3 | |
| dc.source.journal | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | |
| dc.source.numberofpages | 10 | |
| dc.source.volume | 40 | |
| dc.subject.discipline | Applied physics | |
| dc.subject.keywords | RU | |
| dc.subject.keywords | MO | |
| dc.subject.keywords | Direct metal etch | |
| dc.subject.keywords | Molybdenum | |
| dc.subject.keywords | Ruthenium | |
| dc.subject.keywords | dry etch | |
| dc.title | Patterning challenges for direct metal etch of ruthenium and molybdenum at 32 nm metal pitch and below | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | Original bundle
| |
| Publication available in collections: |