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Investigation and comparison of the noise in the gate and substrate current after soft-breakdown
Publication:
Investigation and comparison of the noise in the gate and substrate current after soft-breakdown
Date
1999
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Crupi, Felice
;
Degraeve, Robin
;
Groeseneken, Guido
;
Nigam, Tanya
;
Maes, Herman
Journal
Japanese Journal of Applied Physics. Part 1: Regular Papers
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1948
since deposited on 2021-10-06
Acq. date: 2025-10-23
Citations
Metrics
Views
1948
since deposited on 2021-10-06
Acq. date: 2025-10-23
Citations